Aktivní norma | Vydána: 09.12.2007

IEEE/IEC 62526-2007

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Dostupné jazyky: Anglicky

Dostupné provedení: Zabezpečené PDF - okamžité stažení

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Podrobné informace

Označení: IEEE/IEC 62526-2007

Datum vydání: 09.12.2007

Stran: 0

Země: Mezinárodní technická norma

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Anotace

New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test
generation tools and test equipment. Extensions to the test interface language (contained in this
standard) are defined that (1) facilitate the use of the language in the design environment and
(2) facilitate the use of the language for large designs encompassing subdesigns with reusable
patterns.

ISBN: 9-7807-3815-7221
Number of Pages: 128
Product Code: STD95741
Keywords: advanced scan architecture, core, environment, fail feedback, lockstep, parallel
patterns, parameterized data, pattern tiling, pragma, signal variable, system on chip (SoC), test
protocol
Category: Test Instrumentation and Techniques

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