Aktivní norma | Vydána: 31.01.2018

IEEE 1804-2017

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

Dostupné jazyky: Anglicky

Dostupné provedení: Zabezpečené PDF - okamžité stažení, Tištěné

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Podrobné informace

Označení: IEEE 1804-2017

Datum vydání: 31.01.2018

Stran: 29

Země: Mezinárodní technická norma

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Anotace

New IEEE Standard - Active.
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips – SOCs) with different cores and modules, for which test patterns have been independently generated.

ISBN: 978-1-5044-4317-3, 978-1-5044-4318-0
Number of Pages: 29
Product Code: STD22771, STDPD22771
Keywords: ATPG, DFT, fault models, fault simulation, IEEE 1804, semiconductor testing, stuck-at faults, test coverage.
Category: Test Technology

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