Aktivní norma | Vydána: 05.11.2015

ISO 19830:2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
(Analyse chimique des surfaces — Spectroscopie d´électrons — Exigences minimales pour le rapport d´ajustement de pic en spectroscopie de photoélectrons X)

Dostupné jazyky: Anglicky

Dostupné provedení: Elektronické PDF, Tištěné

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Podrobné informace

Označení: ISO 19830:2015

Datum vydání: 05.11.2015

Stran: 22

Země: Mezinárodní technická norma

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Anotace

Description / Abstract: ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

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