IEC/TS 63202-2-ed.1.0

Detailinformationen

Bezeichnung: IEC/TS 63202-2-ed.1.0

Ausgabedatum: 16.12.2021

Seiten: 19

Land: Internationale technische Norm

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Erhältlich auf www.technormen.de

Annotation

IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.