IEC/TS 63202-2-ed.1.0

Podrobné informace

Označení: IEC/TS 63202-2-ed.1.0

Datum vydání: 16.12.2021

Stran: 19

Země: Mezinárodní technická norma

Kde koupit?

Můžete zakoupit na eshop.normservis.cz

Anotace

IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.