IEEE 1450.1-2025

Detailinformationen

Bezeichnung: IEEE 1450.1-2025

Ausgabedatum: 26.06.2025

Seiten: 141

Land: Internationale technische Norm

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Erhältlich auf www.technormen.de

Annotation

Revision Standard - Active.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

ISBN: 979-8-8557-2140-9, 979-8-8557-2141-6
Number of Pages: 141
Product Code: STD27889, STDPD27889
Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocol
Category: Test Technology