Aktivní norma | Vydána: 26.06.2025

IEEE 1450.1-2025

IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Dostupné jazyky: Anglicky

Dostupné provedení: Zabezpečené PDF - okamžité stažení, Tištěné

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Podrobné informace

Označení: IEEE 1450.1-2025

Datum vydání: 26.06.2025

Stran: 141

Země: Mezinárodní technická norma

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Anotace

Revision Standard - Active.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

ISBN: 979-8-8557-2140-9, 979-8-8557-2141-6
Number of Pages: 141
Product Code: STD27889, STDPD27889
Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocol
Category: Test Technology

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