SAE AS6171/2A

Detailinformationen

Bezeichnung: SAE AS6171/2A

Ausgabedatum: 01.05.2017

Seiten: 0

Land: Amerikanische technische Norm

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Annotation

This document describes the requirements of the following test methods for counterfeit detection of electronic components:a
Method A: General EVI, Sample Selection, and Handling

b
Method B: Detailed EVI, including Part Weight measurement

c
Method C: Testing for Remarking

d
Method D: Testing for Resurfacing

e
Method E: Part Dimensions measurement

f
Method F: Surface Texture Analysis using SEM


The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

SUBJECT TAXONOMY: Electronic equipment, Risk management, Supplier assessment, Supply chain management, Counterfeit parts, Test procedures, Inspections
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard