Active standard | Published: 01/05/2017

SAE AS6171/2A

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods

Available languages: English

Available design: electronic design (pdf), Print design

from 129.50 EUR show on eshop

Detail information

Designation: SAE AS6171/2A

Publication date: 01/05/2017

Pages: 0

Country: American technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

This document describes the requirements of the following test methods for counterfeit detection of electronic components:a
Method A: General EVI, Sample Selection, and Handling

b
Method B: Detailed EVI, including Part Weight measurement

c
Method C: Testing for Remarking

d
Method D: Testing for Resurfacing

e
Method E: Part Dimensions measurement

f
Method F: Surface Texture Analysis using SEM

The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

SUBJECT TAXONOMY: Electronic equipment, Risk management, Supplier assessment, Supply chain management, Counterfeit parts, Test procedures, Inspections
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard

Popular Publishers

full catalog