GB - Chinese national standards

Lithium wafers

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Specification for polished test silicon wafers

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practice for shallow etch pit detection on silicon

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Standard test method for dimensions of notches on silicon wafers

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Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method

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Annealed monocrystalline silicon wafers

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Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method

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Monocrystalline silicon and wafers for solar cells

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Germanium single crystal for solar cell

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Safety guideling for the evaluation of toxic and flammable gas detection systems

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