GB - Chinese national standards

Test method for instrumental neutron activation analysis (INAA) of silicon

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for thickness and fltaness of monocrystalline silicon carbide wafers

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Specification for order entry format of silicon wafers

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Assembly tools for screws and nuts—Dimensions of machine-operated “impact” square drive sockets

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for warp and bow of silicon wafers—Automated non-contact scanning method

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for disoclation density of GaN single crystal—Cathodoluminescence spectroscopy

Available languages: English, Chinese

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Test method for vapor attack on refractories for furnace superstructures

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Hot-rolled steel H piles

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Methods of determination and calculation of heat balance for hot blast stove in blast furnace

Available languages: English, Chinese

Available design: electronic design (pdf), Print design