GB - Chinese national standards

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GB/T 14123-2012 (5.11.2012)

GB/T 14123-2012 (05/11/2012)

Mechanical shock - Testing machines - Characteristics and performance

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 640.80 USD more info
GB/T 14124-2024 (31.12.2024)

GB/T 14124-2024 (31/12/2024)

Mechanical vibration and shock—Vibration of fixed structures—Guidelines for the measurement of vibrations and evaluation of their effects on structures

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 1 000.80 USD more info
GB/T 1413-2023 (17.3.2023)

GB/T 1413-2023 (17/03/2023)

Series 1 freight containers—Classification,dimensions and ratings

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 384.00 USD more info
GB/T 14139-2019 (4.6.2019)

GB/T 14139-2019 (04/06/2019)

Silicon epitaxial wafers

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 238.80 USD more info
GB 1414-1979 (1.1.1979)

GB 1414-1979 (01/01/1979)

-

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

GB/T 1414-2013 (9.6.2013)

GB/T 1414-2013 (09/06/2013)

General purpose metric screw threads - The plan for pipe systems

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 178.80 USD more info
GB/T 14140-2025 (1.8.2025)

GB/T 14140-2025 (01/08/2025)

Test method for measuring diameter of semiconductor wafer

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 250.80 USD more info
GB/T 14141-2009 (30.10.2009)

GB/T 14141-2009 (30/10/2009)

Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 274.80 USD more info
GB/T 14142-2017 (29.9.2017)

GB/T 14142-2017 (29/09/2017)

Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 166.80 USD more info
GB/T 14144-2009 (30.10.2009)

GB/T 14144-2009 (30/10/2009)

Testing method for determination of radial interstitial oxygen variation in silicon

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

from 250.80 USD more info
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