GB - Chinese national standards

Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Metallic materials—Testing methods for creep crack and creep-fatigue crack growth rates

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Corrosion of metals and alloys—Corrosion test of flowing water in seawater pipeline

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for thickness of silicon carbide epitaxial layer—Infrared reflectance method

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Graphite materials—Test method for equivalent boron contents—Inductively coupled plasma atomic emission spectrometry

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Determination of organic halogen content in textile dyeing and finishing auxiliaries

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Electrically conductive adhesive tape for wireless terminal equipment application

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Synthetic cryolite

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Synthetic cryolite

Available languages: English, Chinese

Available design: electronic design (pdf), Print design