IEC - International electro-technical commission

Amendment 1 - Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Characteristics of hollow pressurised and unpressurised ceramic and glass insulators for use in electrical equipment with rated voltages greater than 1000 V

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution
(Instrumentation nucleaire - Scintillateurs montes - Methodes d´essai de lumiere sortante et de resolution intrinseque)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
(Dispositifs a semiconducteurs - Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET) - Partie 1: Essai rapide de BTI pour les MOSFET)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
(Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET))

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
(Dispositifs a semiconducteurs - Partie 1: Essai de rupture dielectrique en fonction du temps (TDDB) pour les couches intermetalliques)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
(Dispositifs a semiconducteurs - Essai de rupture dielectrique en fonction du temps (TDDB) pour films dielectriques de grille)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Video systems (625/50 progressive) - Video and accompanied data using the vertical blanking interval - Analogue interface
(Systemes video (625/50 progressif) - Donnees video et donnees associees utilisant l´intervalle de suppression de trame - Interface analogique)

Available languages: English, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Common control interface for networked digital audio and video products - Part 1: General
(Interface de commande commune des produits audio et video numeriques connectes en reseaux - Partie 1: Generalites)

Available languages: English, Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM