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IEEE - Advanced technology for mankind
Page 235
IEEE 1226.6-1996 (26/06/1996) Withdrawn
IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard
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IEEE 1227-1990 (30/11/1990) Withdrawn
IEEE Guide for the Measurement of DC Electric-Field Strength and Ion Related Quantities
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IEEE 1228-1994 (30/11/1993) Withdrawn
IEEE Standard for Software Safety Plans
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IEEE 1232-1995 (15/03/1996) Withdrawn
IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture
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IEEE 1232-2010 (25/03/2011) Withdrawn
IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
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IEEE 1232.1-1997 (05/09/1997) Withdrawn
IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification
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IEEE 1232.2-1998 (19/02/1999) Withdrawn
IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Service Specification
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IEEE 1233-1996 (22/12/1996) Withdrawn
IEEE Guide for Developing System Requirements Specifications
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IEEE 1233-1998 (29/12/1998) Withdrawn
IEEE Guide for Developing System Requirements Specifications
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IEEE 1234-2007 (12/07/2007) Withdrawn
IEEE Guide for Fault Locating Techniques on Shielded Power Cable Systems
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