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IEEE - Advanced technology for mankind
Page 509
IEEE C62.35-1987 (31/01/1989) Withdrawn
IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices
Available languages: English
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IEEE C62.35-2010 (31/08/2010) Withdrawn
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
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IEEE C62.35-2010/Cor 1-2018 (12/12/2018) Withdrawn
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1
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IEEE C62.36-1991 (10/02/1992) Withdrawn
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
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IEEE C62.36-1994 (31/03/1995) Withdrawn
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
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IEEE C62.36-2000 (13/10/2000) Withdrawn
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
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IEEE C62.36-2014 (09/07/2014) Withdrawn
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
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IEEE C62.37-1996 (30/11/1996) Withdrawn
IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices
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from 146.00 EUR more info
IEEE C62.37.1-2000 (18/04/2001) Withdrawn
IEEE Guide for the Application of Thyristor Surge Protective Devices
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IEEE C62.37.1-2012 (26/04/2013) Withdrawn
IEEE Guide for the Application of Thyristor Surge Protective Device Components
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