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JIS - Japanese technical standards
Page 338
JIS C5568:1997 (28/02/1997)
Magnetic tape sound recording and reproducing systems Part 7: Cassette for commercial tape records and domestic use
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 800.00 EUR more info
JIS C5569:1991 (28/02/1991)
Method of measurement of speed fluctuations in sound recording and reproducing equipment
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 500.00 EUR more info
JIS C5581:1987 (29/02/1988)
Helical-scan video tape cassette system using 12.65 mm (0.5 in) magnetic tape on type VHS
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR more info
JIS C5583:1992 (31/08/1992)
Helical-scan video tape cassette system using 8 mm magnetic tape -- 8 mm Video
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 3 600.00 EUR more info
JIS C5600:2006 (20/11/2006)
Glossary of basic terms used in electrotechnology
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 6 000.00 EUR more info
JIS C5601:1975 (30/06/1975)
Glossary of terms used in electronics and telecommunications (radiotelecommunications No.1)
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 500.00 EUR more info
JIS C5602:1986 (31/03/1986)
Glossary of passive components for electronic equipment
Available languages: English, Japanese
Available design: electronic design (pdf), Print design
from 19 100.00 EUR more info
JIS C5603:1993 (31/07/1993)
Terms and definitions for printed circuits
Available languages: English, Japanese
Available design: electronic design (pdf), Print design
from 14 100.00 EUR more info
JIS C5630-1:2017 (21/03/2017)
Semiconductor devices -- Micro-electromechanical devices -- Part 1: Terms and definitions
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 4 100.00 EUR more info
JIS C5630-12:2014 (20/02/2014)
Semiconductor devices -- Micro-electromechanical devices -- Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 3 600.00 EUR more info
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