JIS - Japanese technical standards

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JIS C6187-1:2016 (20.5.2016)

JIS C6187-1:2016 (20/05/2016)

Optical wavelength meters -- Part 1: Test methods

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 3 508.70 USD more info
JIS C6187-2:2014 (20.3.2014)

JIS C6187-2:2014 (20/03/2014)

Optical wavelength meters -- Part 2: Calibration

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 5 029.10 USD more info
JIS C6188:2021 (21.9.2021)

JIS C6188:2021 (21/09/2021)

Calibration method of measuring optical attenuators

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 3 508.70 USD more info
JIS C61882:2023 (21.8.2023)

JIS C61882:2023 (21/08/2023)

Hazard and operability studies (HAZOP studies) -- Application guide

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 5 964.80 USD more info
JIS C6189:2022 (21.2.2022)

JIS C6189:2022 (21/02/2022)

Test methods of optical return loss meters

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 4 210.40 USD more info
JIS C6190:2022 (20.6.2022)

JIS C6190:2022 (20/06/2022)

Test methods for fiber optic test sources

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 3 508.70 USD more info
JIS C6191:2019 (20.3.2019)

JIS C6191:2019 (20/03/2019)

Test methods of tuneable laser sources

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 4 795.20 USD more info
JIS C6192-1:2025 (20.11.2025)

JIS C6192-1:2025 (20/11/2025)

Lasers and laser-related equipment-Test methods for laser beam widths, divergence angles and beam propagation ratios-Part 1: Stigmatic and simple astigmatic beams

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 9 590.40 USD more info
JIS C6192-2:2025 (20.11.2025)

JIS C6192-2:2025 (20/11/2025)

Lasers and laser-related equipment-Test methods for laser beam widths, divergence angles and beam propagation ratios-Part 2: General astigmatic beams

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 9 590.40 USD more info
JIS C62024-1:2022 (22.8.2022)

JIS C62024-1:2022 (22/08/2022)

High frequency inductive components -- Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor

Available languages: Japanese

Available design: electronic design (pdf), Print design

from 4 210.40 USD more info
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