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JIS - Japanese technical standards
Page 919
JIS R1636:1998 (31/01/1998)
Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
Available languages: English, Japanese
Available design: electronic design (pdf), Print design
from 4 000.00 EUR more info
JIS R1637:1998 (31/01/1998)
Test method for resistivity of conductive fine ceramic thin films with a four-point probe array
Available languages: English, Japanese
Available design: electronic design (pdf), Print design
from 4 000.00 EUR more info
JIS R1638:1999 (31/05/1999)
Test methods of iso-electric point of fine ceramic powders
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR more info
JIS R1639-1:1999 (31/05/1999)
Test methods of properties of fine ceramic granules Part 1: Size distribution of granules
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 200.00 EUR more info
JIS R1639-2:1999 (31/05/1999)
Test methods of properties of fine ceramic granules Part 2: Bulk density
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 800.00 EUR more info
JIS R1639-3:1999 (31/05/1999)
Test methods of properties of fine ceramic granules Part 3: Drying loss
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 800.00 EUR more info
JIS R1639-4:1999 (31/05/1999)
Test methods of properties of fine ceramic granules Part 4: Flowability
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 200.00 EUR more info
JIS R1639-5:2007 (20/02/2007)
Test methods of properties of fine ceramic granules Part 5: Compressive strength of a single granule
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR more info
JIS R1639-6:2007 (20/02/2007)
Test methods of properties of fine ceramic granules Part 6: Compressive behavior of the granule beds
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR more info
JIS R1640:2002 (31/01/2002)
Methods for the quantitative phase analysis of silicon nitride
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR more info
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