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Field-effect transistors. General requirements for measuring electrical parameters
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Shot-circuit forward transfer admittance modulus measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Drain current for vgs=0 impulse measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Short-circint equivalent input noise voltage measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Drain residual current measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Drain source resistance measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Method of measuring output power, power gain and drain efficiency
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Noise figure measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Forward transconductance measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
Field-effect transistors. Active output conductance component measurement technique
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design