STN - Slovak standards

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors

Available languages: English

Available design: Print design

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Available languages: English

Available design: Print design

Microprocessor integrated circuits. Technical terms, definitions and symbols of electrical parameters

Available design: Print design

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Available languages: English

Available design: Print design

Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Available design: Print design

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

Available languages: English

Available design: Print design

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

Available languages: English

Available design: Print design

Integrované obvody. Meranie elektromagnetickej odolnosti. Časť 2: Meranie odolnosti proti vyžarovaniu. Metóda buniek TEM a širokopásmových buniek TEM (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design