Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Withdrawn | Published: 10/05/2003
ASTM E1127-03 Withdrawn
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Available languages: English
Available design: Online Secure PDF
from 86.00 USD
show on eshop
Detail information
Designation: ASTM E1127-03
Publication date: 10/05/2003
Pages: 5
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
