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Withdrawn | Published: 01/06/2015
ASTM E1127-08(2015) Withdrawn
Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)
Available languages: English
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Detail information
Designation: ASTM E1127-08(2015)
Publication date: 01/06/2015
Pages: 5
Note: Withdrawn
Country: American technical standard
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Keywords:angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films,, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
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