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Withdrawn | Published: 15/06/2008
ASTM E766-98(2008)e1 Withdrawn
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope (Includes all amendments And changes 3/19/2014).
Available languages: English
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Detail information
Designation: ASTM E766-98(2008)e1
Publication date: 15/06/2008
Pages: 6
Note: Withdrawn
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:calibration, magnification, pitch, scanning electron microscope, Calibration--microscopes, Electron microscopy, Magnification, Scanning electron microscope (SEM), ICS Number Code 37.020 (Optical equipment)
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