Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Withdrawn | Published: 01/06/2017
ASTM E986-04(2017) Withdrawn
Standard Practice for Scanning Electron Microscope Beam Size Characterization
Available languages: English
Available design: Online Secure PDF
from 69.70 EUR
show on eshop
Detail information
Designation: ASTM E986-04(2017)
Publication date: 01/06/2017
Pages: 3
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:electron beam size, E766, graphite fiber, magnification, NIST-SRM 2069B, resolution, SEM, SEM performance, spot size, waveform ,, ICS Number Code 31.120 (Electronic display devices),37.020 (Optical equipment)
Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
