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Withdrawn | Published: 01/07/2006
ASTM F1192-00(2006) Withdrawn
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM F1192-00(2006)
Publication date: 01/07/2006
Pages: 11
Note: Withdrawn
Country: American technical standard
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Keywords:SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment, ICS Number Code 31.080.01 (Semi-conductor devices in general)
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