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Active standard | Published: 01/05/2024
ASTM F1192-24
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Available languages: English
Available design: Online Secure PDF, Standard + Redline - Online secure PDF, Print design, Print + redline
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Detail information
Designation: ASTM F1192-24
Publication date: 01/05/2024
Pages: 12
Country: American technical standard
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Keywords:SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment,, ICS Number Code 31.080.01 (Semi-conductor devices in general)
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