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Active standard | Published: 30/11/2016
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.
Available languages: English
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Detail information
Designation: BS EN 60749-44:2016
Publication date: 30/11/2016
Pages: 26
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 86203 8 Status: DefinitivePopular Publishers
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