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Active standard | Published: 31/10/2013
BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices. Bend testing methods of thin film materials.
Available languages: English
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Detail information
Designation: BS EN 62047-18:2013
Publication date: 31/10/2013
Pages: 18
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 72011 6 Status: DefinitivePopular Publishers
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