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Active standard | Published: 30/06/2011
BS EN 62374-1:2010
Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers.
Available languages: English
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Detail information
Designation: BS EN 62374-1:2010
Publication date: 30/06/2011
Pages: 20
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 75206 3 Status: DefinitivePopular Publishers
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