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Active standard | Published: 31/10/2008
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films.
Available languages: English
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Detail information
Designation: BS EN 62374:2007
Publication date: 31/10/2008
Pages: 24
Country: British technical standard
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You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 54048 6 Status: Under ReviewPopular Publishers
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