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Active standard | Published: 21/01/2026
BS EN IEC 60749-22-2:2026
Semiconductor devices — Mechanical and climatic test methods. Bond strength — Wire bond shear test methods.
Available languages: English
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Detail information
Designation: BS EN IEC 60749-22-2:2026
Publication date: 21/01/2026
Pages: 40
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 34067 9 Status: DefinitivePopular Publishers
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