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Active standard | Published: 30/03/2023
BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET.
Available languages: English
Available design: PDF - Immediate download, Print design
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Detail information
Designation: BS IEC 62373-1:2020
Publication date: 30/03/2023
Pages: 26
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 51373 2 Status: DefinitivePopular Publishers
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