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Active standard | Published: 03/01/2023
BS ISO 17109:2022-TC
Tracked Changes. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films.
Available languages: English
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Detail information
Designation: BS ISO 17109:2022-TC
Publication date: 03/01/2023
Pages: 68
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 24254 6 Status: DefinitivePopular Publishers
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