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Active standard | Published: 21/11/2024
BS ISO 20263:2024-TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.
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Detail information
Designation: BS ISO 20263:2024-TC
Publication date: 21/11/2024
Pages: 145
Country: British technical standard
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You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 34372 4 Status: DefinitivePopular Publishers
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