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Withdrawn | Published: 01/12/2017
ČSN EN 60749-28 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
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Detail information
Designation: ČSN EN 60749-28
Publication date: 01/12/2017
Pages: 56
Note: Withdrawn
Country: Czech technical standard
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