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Withdrawn | Published: 01/08/2005
ČSN EN 60749-30 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount device prior to reliability testing
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Detail information
Designation: ČSN EN 60749-30
Publication date: 01/08/2005
Pages: 36
Note: Withdrawn
Country: Czech technical standard
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