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Active standard | Published: 30/10/2009
GB/T 13388-2009
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 268.10 EUR
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Detail information
Designation: GB/T 13388-2009
Publication date: 30/10/2009
Pages: 0
Country: Chinese technical standard
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