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Active standard | Published: 21/05/2021
GB/T 14146-2021
Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 266.80 EUR
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Detail information
Designation: GB/T 14146-2021
Publication date: 21/05/2021
Pages: 0
Country: Chinese technical standard
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