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Active standard | Published: 10/12/2015
GB/T 32188-2015
The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
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Detail information
Designation: GB/T 32188-2015
Publication date: 10/12/2015
Pages: 0
Country: Chinese technical standard
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