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Active standard | Published: 28/08/2026
GB/T 42709.29-2026
Semiconductor devices—Micro-electromechanical devices—Part 29: Electromechanical relaxation test method for freestanding conductive thin films under room temperature
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 472.80 USD
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Detail information
Designation: GB/T 42709.29-2026
Publication date: 28/08/2026
Pages: 0
Country: Chinese technical standard
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You can buy at www.mystandards.bizPopular Publishers
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