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Active standard | Published: 30/04/2026
GB/T 45716.1-2026
Semiconductor devices—Bias-temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)—Part 1: Fast bias-temperature instability test for MOSFETs
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 477.20 EUR
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Detail information
Designation: GB/T 45716.1-2026
Publication date: 30/04/2026
Pages: 0
Country: Chinese technical standard
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