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Active standard | Published: 01/09/2010
GOST R 8.698-2010
State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
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Detail information
Designation: GOST R 8.698-2010
Publication date: 01/09/2010
Pages: 38
Country: Russian technical standard
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