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Active standard | Published: 11/10/2017
IEC/TR 63133-ed.1.0
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 3 578.60 CZK
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Detail information
Designation: IEC/TR 63133-ed.1.0
Publication date: 11/10/2017
Pages: 17
Country: International technical standard
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You can buy at www.mystandards.bizAnotation
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.Popular Publishers
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