Active standard | Published: 11/10/2022

IEC/TS 62607-6-20-ed.1.0

Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry

Available languages: English

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Detail information

Designation: IEC/TS 62607-6-20-ed.1.0

Publication date: 11/10/2022

Pages: 0

Country: International technical standard

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Anotation

IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic - metallic impurity content for powders of graphene-based materials by - inductively coupled plasma mass spectrometry (ICP-MS). The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS. - The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO). – The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.

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