Aktivní norma | Vydána: 11.10.2022

IEC/TS 62607-6-20-ed.1.0

Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry

Dostupné jazyky: Anglicky

Dostupné provedení: Elektronické PDF, Tištěné, CD-ROM

od 6 543.40 CZK zobrazit na eshopu

Podrobné informace

Označení: IEC/TS 62607-6-20-ed.1.0

Datum vydání: 11.10.2022

Stran: 0

Země: Mezinárodní technická norma

Kde koupit?

Můžete zakoupit na eshop.normservis.cz

Anotace

IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic - metallic impurity content for powders of graphene-based materials by - inductively coupled plasma mass spectrometry (ICP-MS). The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS. - The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO). – The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.

Populární vydavatelé

celý katalog