Active standard | Published: 10/12/2025

IEC/TS 62607-6-26-ed.1.0

Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

from 6 543.40 CZK show on eshop

Detail information

Designation: IEC/TS 62607-6-26-ed.1.0

Publication date: 10/12/2025

Pages: 26

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs) • Youngs modulus (or elastic modulus), • residual strain, • residual stress, and • fracture stress of 2D materials and nanoscale films using the • bulge test. The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties. • This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres. • This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.

Popular Publishers

full catalog