Active standard | Published: 30/08/2002

IEC 60749-1-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

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Detail information

Designation: IEC 60749-1-ed.1.0

Publication date: 30/08/2002

Pages: 15

Country: International technical standard

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Anotation

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres)et etablit des dispositions communes a toutes les autres parties de la serie. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.

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