Active standard | Published: 17/01/2003

IEC 60749-16-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 16: Detection de bruit d´impact de particules (PIND))

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 29.70 USD show on eshop

Detail information

Designation: IEC 60749-16-ed.1.0

Publication date: 17/01/2003

Pages: 13

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills). Definit un essai permettant de detecter la presence de particules libres a linterieur dun dispositif a cavite, comme des particules de ceramique, des elements de fil de liaison ou des boules de brasure (granules).

Popular Publishers

full catalog