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Active standard | Published: 12/08/2003
IEC 60749-2-ed.1.0/Cor.1 Correction
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 2: Basse pression atmospherique)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
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Detail information
Designation: IEC 60749-2-ed.1.0/Cor.1
Publication date: 12/08/2003
Pages: 0
Note: Correction
Country: International technical standard
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Modification of the validity date: now put at 2007. Modification de la date de validite : fixee maintenant a 2007.Popular Publishers
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